Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping

Bin Zhou, Liyi Xiao, Yizheng Ye, Xin-chun Wu. Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping. J. Electronic Testing, 27(1):43-56, 2011. [doi]

Authors

Bin Zhou

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Liyi Xiao

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Yizheng Ye

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Xin-chun Wu

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