Bin Zhou, Liyi Xiao, Yizheng Ye, Xin-chun Wu. Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping. J. Electronic Testing, 27(1):43-56, 2011. [doi]
@article{ZhouXYW11,
title = {Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping},
author = {Bin Zhou and Liyi Xiao and Yizheng Ye and Xin-chun Wu},
year = {2011},
doi = {10.1007/s10836-010-5185-4},
url = {http://dx.doi.org/10.1007/s10836-010-5185-4},
tags = {optimization, rule-based, testing, slicing},
researchr = {https://researchr.org/publication/ZhouXYW11},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {27},
number = {1},
pages = {43-56},
}