Bin Zhou, Yizheng Ye, Zhao-lin Li, Xin-chun Wu, Rui Ke. A new low power test pattern generator using a variable-length ring counter. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 248-252, IEEE, 2009. [doi]
Abstract is missing.