Statistical SDFC: A metric for evaluating test quality of small delay faults - researchr publication authors

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Xuefeng Zhu, Huawei Li, Xiaowei Li 0001. Statistical SDFC: A metric for evaluating test quality of small delay faults. In Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, VLSI-DAT 2012, Hsinchu, Taiwan, April 23-25, 2012. pages 1-4, IEEE, 2012. [doi]

This author has not been identified. Look up 'Xuefeng Zhu' in GoogleThis author has not been identified. Look up 'Huawei Li' in GoogleThis author has not been identified. Look up 'Xiaowei Li 0001' in Google

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