Statistical SDFC: A metric for evaluating test quality of small delay faults

Xuefeng Zhu, Huawei Li, Xiaowei Li 0001. Statistical SDFC: A metric for evaluating test quality of small delay faults. In Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, VLSI-DAT 2012, Hsinchu, Taiwan, April 23-25, 2012. pages 1-4, IEEE, 2012. [doi]

Abstract

Abstract is missing.