Xuefeng Zhu, Huawei Li, Xiaowei Li 0001. Statistical SDFC: A metric for evaluating test quality of small delay faults. In Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, VLSI-DAT 2012, Hsinchu, Taiwan, April 23-25, 2012. pages 1-4, IEEE, 2012. [doi]
@inproceedings{ZhuL012-0,
title = {Statistical SDFC: A metric for evaluating test quality of small delay faults},
author = {Xuefeng Zhu and Huawei Li and Xiaowei Li 0001},
year = {2012},
doi = {10.1109/VLSI-DAT.2012.6212623},
url = {http://dx.doi.org/10.1109/VLSI-DAT.2012.6212623},
researchr = {https://researchr.org/publication/ZhuL012-0},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, VLSI-DAT 2012, Hsinchu, Taiwan, April 23-25, 2012},
publisher = {IEEE},
isbn = {978-1-4577-2080-2},
}