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Deep-level defects study of arsenic-implanted ZnO single crystal

C. Y. Zhu, C. C. Ling, G. Brauer, W. Anwand, W. Skorupa. Deep-level defects study of arsenic-implanted ZnO single crystal. Microelectronics Journal, 40(2):286-288, 2009. [doi]

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C. Y. Zhu

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C. C. Ling

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G. Brauer

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W. Anwand

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W. Skorupa

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