C. Y. Zhu, C. C. Ling, G. Brauer, W. Anwand, W. Skorupa. Deep-level defects study of arsenic-implanted ZnO single crystal. Microelectronics Journal, 40(2):286-288, 2009. [doi]
@article{ZhuLBAS09,
title = {Deep-level defects study of arsenic-implanted ZnO single crystal},
author = {C. Y. Zhu and C. C. Ling and G. Brauer and W. Anwand and W. Skorupa},
year = {2009},
doi = {10.1016/j.mejo.2008.07.037},
url = {http://dx.doi.org/10.1016/j.mejo.2008.07.037},
tags = {C++},
researchr = {https://researchr.org/publication/ZhuLBAS09},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {40},
number = {2},
pages = {286-288},
}