Deep-level defects study of arsenic-implanted ZnO single crystal

C. Y. Zhu, C. C. Ling, G. Brauer, W. Anwand, W. Skorupa. Deep-level defects study of arsenic-implanted ZnO single crystal. Microelectronics Journal, 40(2):286-288, 2009. [doi]

Abstract

Abstract is missing.