Yuming Zhuang, Tao Chen, Shravan Chaganti, Degang Chen. Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-6, IEEE Computer Society, 2016. [doi]
Abstract is missing.