The following publications are possibly variants of this publication:
- Accurate Spectral Testing with Impure Test Stimulus for Multi-tone TestYuming Zhuang, Degang Chen. itc-asia 2018: 97-102 [doi]
- Effect of flicker noise on SEIR for accurate ADC linearity testingYuming Zhuang, Tao Chen 0006, Shravan K. Chaganti, Degang Chen. mwscas 2015: 1-4 [doi]
- Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removalLe Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger. tim, 54(3):1188-1199, 2005. [doi]
- Accurate testing of ADC s spectral performance using imprecise sinusoidal excitationsZhongjun Yu, Degang Chen, Randall L. Geiger. iscas 2004: 645-648 [doi]
- Linearity testing of ADCs using low linearity stimulus and Kalman filteringBharath K. Vasan, Randall L. Geiger, Degang Chen. iscas 2010: 3032-3035 [doi]
- Accurate Spectral Testing With Impure Source and Noncoherent SamplingBenjamin Magstadt, Yuming Zhuang, Degang Chen. tim, 65(11):2454-2463, 2016. [doi]