Variation-aware gate sizing and clustering for post-silicon optimized circuits

Cheng Zhuo, David Blaauw, Dennis Sylvester. Variation-aware gate sizing and clustering for post-silicon optimized circuits. In Vijaykrishnan Narayanan, C. P. Ravikumar, Jörg Henkel, Ali Keshavarzi, Vojin G. Oklobdzija, Barry M. Pangrle, editors, Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008, Bangalore, India, August 11-13, 2008. pages 105-110, ACM, 2008. [doi]

Abstract

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