Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra. BIST Power Reduction Using Scan-Chain Disable in the Cell Processor. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-8, IEEE, 2006. [doi]
@inproceedings{ZoellinWML06,
title = {BIST Power Reduction Using Scan-Chain Disable in the Cell Processor},
author = {Christian G. Zoellin and Hans-Joachim Wunderlich and Nicolas Mäding and Jens Leenstra},
year = {2006},
doi = {10.1109/TEST.2006.297695},
url = {http://dx.doi.org/10.1109/TEST.2006.297695},
researchr = {https://researchr.org/publication/ZoellinWML06},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006},
editor = {Scott Davidson and Anne Gattiker},
publisher = {IEEE},
isbn = {1-4244-0292-1},
}