Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra. BIST Power Reduction Using Scan-Chain Disable in the Cell Processor. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-8, IEEE, 2006. [doi]
Abstract is missing.