Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine. Failure Analysis and Test Solutions for Low-Power SRAMs. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 459-460, IEEE Computer Society, 2011. [doi]
@inproceedings{ZordanBDGPTVB11,
title = {Failure Analysis and Test Solutions for Low-Power SRAMs},
author = {Leonardo Bonet Zordan and Alberto Bosio and Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Aida Todri and Arnaud Virazel and Nabil Badereddine},
year = {2011},
doi = {10.1109/ATS.2011.97},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.97},
researchr = {https://researchr.org/publication/ZordanBDGPTVB11},
cites = {0},
citedby = {0},
pages = {459-460},
booktitle = {Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011},
publisher = {IEEE Computer Society},
isbn = {978-1-4577-1984-4},
}