Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine. Low-power SRAMs power mode control logic: Failure analysis and test solutions. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-10, IEEE Computer Society, 2012. [doi]
Abstract is missing.