Test solution for data retention faults in low-power SRAMs

Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine. Test solution for data retention faults in low-power SRAMs. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 442-447, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]

Abstract

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