Damiano Zuccalà, Jean-Marc Daveau, Philippe Roche, Katell Morin-Allory. Formal Temporal Characterization of Register Vulnerability in Digital Circuits. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2023, Foz do Iguacu, Brazil, June 20-23, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.