Abstract is missing.
- Early and accurate analysis of SoCs: oxymoron or real?Reinaldo A. Bergamaschi. 3-6 [doi]
- Interconnect-power dissipation in a microprocessorNir Magen, Avinoam Kolodny, Uri Weiser, Nachum Shamir. 7-13 [doi]
- Self-consistent power/performance/reliability analysis for copper interconnectsBipin Rajendran, Pawan Kapur, Krishna Saraswat, R. Fabian, W. Pease. 17-22 [doi]
- Investigation of performance metrics for interconnect stack architecturesPuneet Gupta, Andrew B. Kahng, Youngmin Kim, Dennis Sylvester. 23-29 [doi]
- Investigating the frequency dependence elements of CMOS RFIC interconnects for physical modelingBeng Hwee Ong, Choon Beng Sia, Kiat Seng Yeo, Jianguo Ma, Manh Anh Do, Erping Li. 31-38 [doi]
- Interconnect width selection for deep submicron designs using the table lookup methodMandeep Bamal, Evelyn Grossar, Michele Stucchi, Karen Maex. 41-44 [doi]
- A low power approach to system level pipelined interconnect designVikas Chandra, Anthony Xu, Herman Schmit. 45-52 [doi]
- Topology optimization for application-specific networks-on-chipTapani Ahonen, David A. Sigüenza-Tortosa, Hong Bin, Jari Nurmi. 53-60 [doi]
- Evolution as the blind engineer: wiring minimization in the brainDmitri B. Chklovskii. 63 [doi]
- A 2-slot time-division multiplexing (TDM) interconnect network for gigascale integration (GSI)Ajay Joshi, Jeffrey A. Davis. 64-68 [doi]
- NoCIC: a spice-based interconnect planning tool emphasizing aggressive on-chip interconnect circuit methodsVishak Venkatraman, Andrew Laffely, Jinwook Jang, Hempraveen Kukkamalla, Zhi Zhu, Wayne Burleson. 69-75 [doi]
- Optical solutions for system-level interconnectIan O Connor. 79-88 [doi]
- Defect tolerance for nanocomputer architectureArvind Kumar, Sandip Tiwari. 89-96 [doi]
- Prediction of interconnect adjacency distribution: derivation, validation, and applicationsPayman Zarkesh-Ha, Ken Doniger, William Loh, Peter Bendix. 99-106 [doi]
- Prediction of interconnect net-degree distribution based on Rent s ruleTao Wan, Malgorzata Chrzanowska-Jeske. 107-114 [doi]
- A statistical model for estimating the effect of process variations on crosstalk noiseMaurizio Martina, Guido Masera. 115-120 [doi]