Ward De Ceuninck - researchr alias

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Viewing Publication 1 - 19 from 19

2018

Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modulesPhilippe Nivelle, Tom Borgers, Eszter Voroshazi, Jef Poortmans, Jan D'Haen, Ward De Ceuninck, Michael Daenen. irps 2018: 6 [doi]

2017

Single-Shot Detection of Neurotransmitters in Whole-Blood Samples by Means of the Heat-Transfer Method in Combination with Synthetic ReceptorsThijs Vandenryt, Bart van Grinsven, Kasper Eersels, Peter Cornelis, Safira Kholwadia, Thomas Cleij, Ronald Thoelen, Ward De Ceuninck, Marloes Peeters, Patrick Wagner. sensors, 17(12):2701, 2017. [doi]

2014

Array Formatting of the Heat-Transfer Method (HTM) for the Detection of Small Organic Molecules by Molecularly Imprinted PolymersGideon Wackers, Thijs Vandenryt, Peter Cornelis, Evelien Kellens, Ronald Thoelen, Ward De Ceuninck, Patricia Losada-Pérez, Bart van Grinsven, Marloes Peeters, Patrick Wagner. sensors, 14(6):11016-11030, 2014. [doi]

2013

Optimizing the Thermal Read-Out Technique for MIP-Based Biomimetic Sensors: Towards Nanomolar Detection LimitsBram Geerets, Marloes Peeters, Bart van Grinsven, Karolien Bers, Ward De Ceuninck, Patrick Wagner. sensors, 13(7):9148-9159, 2013. [doi]

Combining Electrochemical Impedance Spectroscopy and Surface Plasmon Resonance into one Simultaneous Read-Out System for the Detection of Surface InteractionsThijs Vandenryt, Andrea Pohl, Bart van Grinsven, Ronald Thoelen, Ward De Ceuninck, Patrick Wagner, Jörg Opitz. sensors, 13(11):14650-14661, 2013. [doi]

2012

Embedded Unit for Point-of-Care Impedance Based Biosensor ReadoutJeroen Broeders, Dieter Croux, Ans Weustenraed, Thomas Cleij, Patrick Wagner, Ward De Ceuninck, Wouter Vanaken, Stijn Duchateau, Ronald Thoelen. hpcc 2012: 1571-1577 [doi]

2007

Lifetime modeling of intrinsic gate oxide breakdown at high temperatureR. Moonen, P. Vanmeerbeek, G. Lekens, Ward De Ceuninck, P. Moens, J. Boutsen. mr, 47(9-11):1389-1393, 2007. [doi]

2005

A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structureKris Vanstreels, Marc D'Olieslaeger, Ward De Ceuninck, Jan D'Haen, Karen Maex. mr, 45(3-4):753-759, 2005. [doi]

2004

2003

2002

Statistical aspects of the degradation of LDD nMOSFETsE. Andries, R. Dreesen, K. Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D Olieslaeger, Jan D Haen. mr, 42(9-11):1409-1413, 2002. [doi]

High-resolution SILC measurements of thin SiO::2:: at ultra low voltagesS. Aresu, Ward De Ceuninck, R. Dreesen, K. Croes, E. Andries, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D Olieslaeger. mr, 42(9-11):1485-1489, 2002. [doi]

Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technologyR. Petersen, Ward De Ceuninck, Jan D Haen, Marc D Olieslaeger, Luc De Schepper, O. Vendier, H. Blanck, D. Pons. mr, 42(9-11):1359-1363, 2002. [doi]

How reliable are reliability tests?L. Tielemans, R. Rongen, Ward De Ceuninck. mr, 42(9-11):1339-1345, 2002. [doi]

2001

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