Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping

Bin Zhou, Liyi Xiao, Yizheng Ye, Xin-chun Wu. Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping. J. Electronic Testing, 27(1):43-56, 2011. [doi]

Abstract

Abstract is missing.