A. Benmansour - researchr alias

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Viewing Publication 1 - 5 from 5

2009

Uni-axial mechanical stress effect on Trench Punch through IGBT under short-circuit operationYassine Belmehdi, Stephane Azzopardi, A. Benmansour, J.-Y. Delétage, Eric Woirgard. mr, 49(9-11):1398-1403, 2009. [doi]

2007

A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulationA. Benmansour, Stephane Azzopardi, J. C. Martin, E. Woirgard. mr, 47(9-11):1800-1805, 2007. [doi]

Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditionsA. Benmansour, Stephane Azzopardi, J. C. Martin, E. Woirgard. mr, 47(9-11):1730-1734, 2007. [doi]

2006

Failure mechanism of trench IGBT under short-circuit after turn-offA. Benmansour, S. Azzopardi, J. C. Martin, E. Woirgard. mr, 46(9-11):1778-1783, 2006. [doi]

2005

Assessment of the Trench IGBT reliability: low temperature experimental characterizationS. Azzopardi, A. Benmansour, M. Ishiko, E. Woirgard. mr, 45(9-11):1700-1705, 2005. [doi]

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