A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulation

A. Benmansour, Stephane Azzopardi, J. C. Martin, E. Woirgard. A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulation. Microelectronics Reliability, 47(9-11):1800-1805, 2007. [doi]

Abstract

Abstract is missing.