E. Woirgard - researchr alias

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Viewing Publication 1 - 16 from 16

2015

2) DiodeF. Baccar, Houssam Arbess, L. Théolier, Stephane Azzopardi, E. Woirgard. mr, 55(9-10):1981-1987, 2015. [doi]

Power modules die attach: A comprehensive evolution of the nanosilver sintering physical properties versus its porosityToni Youssef, W. Rmili, E. Woirgard, Stephane Azzopardi, N. Vivet, D. M. Meekhof, Régis Meuret, G. Le Quilliec, C. Richard. mr, 55(9-10):1997-2002, 2015. [doi]

2012

Remaining useful life prediction of lithium batteries in calendar ageing for automotive applicationsA. Eddahech, Olivier Briat, E. Woirgard, J.-M. Vinassa. mr, 52(9-10):2438-2442, 2012. [doi]

2009

Analysis of the dynamic behavior changes of supercapacitors during calendar life test under several voltages and temperatures conditionsH. El Brouji, O. Briat, J.-M. Vinassa, H. Henry, E. Woirgard. mr, 49(9-11):1391-1397, 2009. [doi]

An investigation into the reliability of power modules considering baseplate solders thermal fatigue in aeronautical applicationsA. Micol, A. Zeanh, T. Lhommeau, Stephane Azzopardi, E. Woirgard, O. Dalverny, M. Karama. mr, 49(9-11):1370-1374, 2009. [doi]

2008

Comparison between changes of ultracapacitors model parameters during calendar life and power cycling ageing testsH. El Brouji, O. Briat, J.-M. Vinassa, N. Bertrand, E. Woirgard. mr, 48(8-9):1473-1478, 2008. [doi]

2007

2006

Failure mechanism of trench IGBT under short-circuit after turn-offA. Benmansour, S. Azzopardi, J. C. Martin, E. Woirgard. mr, 46(9-11):1778-1783, 2006. [doi]

Power cycling tests for accelerated ageing of ultracapacitorsO. Briat, W. Lajnef, J.-M. Vinassa, E. Woirgard. mr, 46(9-11):1445-1450, 2006. [doi]

2005

Assessment of the Trench IGBT reliability: low temperature experimental characterizationS. Azzopardi, A. Benmansour, M. Ishiko, E. Woirgard. mr, 45(9-11):1700-1705, 2005. [doi]

Correlation between Experimental Results and FE Simulations to Evaluate Lead-Free BGA Assembly ReliabilityA. Guédon-Gracia, E. Woirgard, C. Zardini. mr, 45(9-11):1652-1657, 2005. [doi]

Specification and use of pulsed current profiles for ultracapacitors power cyclingW. Lajnef, J.-M. Vinassa, O. Briat, E. Woirgard. mr, 45(9-11):1746-1749, 2005. [doi]

2003

IGBT Power modules thermal characterization : what is the optimum between a low current - high voltage or a high current - low voltage test condition for the same electrical power?S. Azzopardi, E. Woirgard, J.-M. Vinassa, O. Briat, C. Zardini. mr, 43(9-11):1901-1906, 2003. [doi]

2002

Reliability study of the assembly of a large EGA on a build up board using thermo-mechanical simulationsP. Guilbault, E. Woirgard, C. Zardini, D. Lambert. mr, 42(9-11):1529-1533, 2002. [doi]

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