Yin Wan - researchr alias

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Viewing Publication 1 - 6 from 6

2024

Iterative ESO-Based Data-Driven Active Disturbance Rejection Learning Control of Czochralski Silicon Single Crystal Growth ProcessJun-Chao Ren, Ding Liu, Yin Wan, Shuyan Shi, Yuyu Liu. amcc 2024: 2905-2910 [doi]

A modeling method of wide random forest multi-output soft sensor with attention mechanism for quality prediction of complex industrial processesYin Wan, Ding Liu, Jun-Chao Ren. aei, 59:102255, 2024. [doi]

2023

Adaptive iterative extended state observer-based data-driven iterative learning model predictive control for semiconductor silicon single crystal batch processJun-Chao Ren, Ding Liu, Yin Wan. jfi, 360(4):3119-3136, March 2023. [doi]

Study on the Hierarchical Predictive Control of Semiconductor Silicon Single Crystal Quality Based on the Soft Sensor ModelYin Wan, Ding Liu, Jun-Chao Ren, Shi-Hai Wu. sensors, 23(5):2830, March 2023. [doi]

2020

Throughput and Delay Analysis of IEEE 802.11-Based Tree-Topology NetworksTakeshi Kanematsu, Yin Wan, Kosuke Sanada, Zhetao Li, Tingrui Pei, Young-June Choi, Kien Nguyen, Hiroo Sekiya. ojcs, 1:1295-1305, 2020. [doi]

2016

Throughput Analysis of WLANs in Saturation and Non-Saturation Heterogeneous Conditions with Airtime ConceptYin Wan, Kosuke Sanada, Nobuyoshi Komuro, Gen Motoyoshi, Norio Yamagaki, Shigeo Shioda, Shiro Sakata, Tutomu Murase, Hiroo Sekiya. ieicet, 99-B(11):2289-2296, 2016. [doi]

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