Journal: IEEE Design & Test of Computers

Volume 11, Issue 3

6 -- 16Erwin Trischler, Mats Johansson. Ten: A Concurrent Test Engineering Environment
17 -- 27Mounir Fares, Bozena Kaminska. Exploring Test Space with Fuzzy Decision Making
28 -- 38Meng-Lieh Sheu, Chung-Len Lee. Simplifying Sequential Circuit Test Generation
39 -- 47Mark Kahrs, Bart N. Locanthi, Robert C. Restrick. Technology Mapping in Circuit Design Aids
48 -- 59Robert F. Sproull, Ivan E. Sutherland, Charles E. Molnar. The Counterflow Pipeline Processor Architecture
60 -- 69Scott Hauck, Steven M. Burns, Gaetano Borriello, Carl Ebeling. An FPGA for Implementing Asynchronous Circuits
80 -- 0. DATC Newsletter