| 0 | -- | 112 | Yervant Zorian, Tom Anderson, Yvon Savaria, Claude Thibeault, André Ivanov. Panel Summaries |
| 0 | -- | 144 | Gil Philips, Yervant Zorian, Charles W. Rosenthal, Bozena Kaminska. Conference Reports |
| 0 | -- | 0 | . News |
| 9 | -- | 11 | Vijay K. Madisetti, Mark A. Richards. Guest Editors Introduction: Advances in Rapid Prototyping of Digital Systems |
| 12 | -- | 22 | Vijay K. Madisetti. Rapid Digital System Prototyping: Current Practice, Future Challenges |
| 32 | -- | 42 | Richard M. Sedmak, John S. Evans. Spanning the Product Life Cycle: RASSP DFT |
| 54 | -- | 65 | Lan-Rong Dung, Vijay K. Madisetti. Conceptual Prototyping of Scalable Embedded DSP Systems |
| 66 | -- | 78 | Sandi Habinc, Peter Sinander. Using VHDL for Board Level Simulation |
| 79 | -- | 87 | Harald P. E. Vranken, Marc F. Witteman, Ronald C. van Wuijtswinkel. Design for Testability in Hardware-Software Systems |
| 88 | -- | 96 | Ramesh Karri, Karin Högstedt, Alex Orailoglu. Computer-Aided Design of Fault-Tolerant VLSI Systems |
| 98 | -- | 101 | Adam Cron. A D&T Special Report: P1149.4 Mixed-Signal Test Bus |
| 102 | -- | 108 | . A D&T Roundtable: Deep-Submicron Test in cooperation with the Test Technology Technical Committee |
| 116 | -- | 117 | . Design Automation Technical Committee Newsletter |
| 118 | -- | 119 | . Test Technology Tc Newsletter |
| 120 | -- | 0 | Scott Davidson. How to achieve 95 fault coverage without really trying |