| 0 | -- | 0 | J. Wilson. CFI leads development of design data standard |
| 0 | -- | 0 | . News |
| 4 | -- | 5 | . Keeping in touch: Reader survey results; planned e-mail survey |
| 8 | -- | 9 | Marc E. Levitt. Guest Editor s Introduction: Microprocessors Lead the Way in Complex Design |
| 10 | -- | 17 | Marc E. Levitt. Designing UltraSparc for Testability |
| 18 | -- | 24 | Lynn Youngs, Siva Paramanandam. Mapping and Repairing Embedded-Memory Defects |
| 25 | -- | 33 | Dilip K. Bhavsar, John H. Edmondson. Alpha 21164 Testability Strategy |
| 34 | -- | 41 | Jainendra Kumar. Prototyping the M68060 for Concurrent Verification |
| 42 | -- | 49 | Margarida F. Jacome, Viktor S. Lapinskii. NREC: Risk Assessment and Planning of Complex Designs |
| 50 | -- | 54 | Robert Wu, Jerry Gerner, Richard Wheelus, Kevin Lew. Testing Logic-Intensive Memory ICs on Memory Testers |
| 55 | -- | 63 | Al Bailey, Tim Lada, Jim Preston. Collateral ASIC Test |
| 64 | -- | 74 | Ghassan Al Hayek, Yves Le Traon, Chantal Robach. Impact of System Partitioning on Test Cost |
| 75 | -- | 83 | . Hardware-Software Codesign |
| 84 | -- | 87 | . Panel Summaries |
| 88 | -- | 90 | . Conference Reports |
| 92 | -- | 93 | . Design Automation Technical Committee Newsletter |
| 94 | -- | 95 | . Test Technology Tc Newsletter |
| 96 | -- | 0 | Scott Davidson. George learns test |