Journal: IEEE Design & Test of Computers

Volume 15, Issue 1

0 -- 0Dilip K. Bhavsar, Yervant Zorian. ITC 97 Panel Sessions
1 -- 0Yervant Zorian. D&T: 15th Year in Service
4 -- 5. News
6 -- 0Teruhiko Yamada. 1997 Asian Test Symposium
8 -- 9Fabrizio Lombardi. Field-Programmable Gate Arrays
10 -- 15Vaughn Betz, Jonathan Rose. How Much Logic Should Go in an FPGA Logic Block?
16 -- 23Miriam Leeser, Waleed Meleis, Mankuan Michael Vai, Silviu M. S. A. Chiricescu, Weidong Xu, Paul M. Zavracky. Rothko: A Three-Dimensional FPGA
24 -- 29Shanzhen Xing, William W. H. Yu. FPGA Adders: Performance Evaluation and Optimal Design
30 -- 38Roger Woods, David W. Trainor, Jean-Paul Heron. Applying an XC6200 to Real-Time Image Processing
39 -- 44Tomoo Inoue, Satoshi Miyazaki, Hideo Fujiwara. Universal Fault Diagnosis for Lookup Table FPGAs
45 -- 50Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian. Testing the Interconnect of RAM-Based FPGAs
51 -- 62Kenneth L. Shepard, Vinod Narayanan. Conquering Noise in Deep-Submicron Digital ICs
63 -- 70Stefano Barbagallo, Davide Medina, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda. Integrating Online and Offline Testing of a Switching Memory
71 -- 82Felice Balarin, Luciano Lavagno, Praveen K. Murthy, Alberto L. Sangiovanni-Vincentelli. Scheduling for Embedded Real-Time Systems
83 -- 90. A D&T Roundtable: Relative Effectiveness of Tests
92 -- 94. Test Technology TC Newsletter
95 -- 0. Design Automation TC Newsletter
96 -- 0Hideo Fujiwara. Needed: Third-generation ATPG Benchmarks