Journal: IEEE Design & Test of Computers

Volume 15, Issue 2

1 -- 0. Our new world
3 -- 0. Letters
4 -- 0Patrick Dewilde. Date 98
5 -- 7. Panel Summaries
8 -- 13Colin Maunder. The Future: Plug and Pray?
14 -- 21Vladimir Székely, Márta Rencz, Bernard Courtois. Tracing the Thermal Behavior of ICs
22 -- 33Kayhan Küçükçakar, Chih-Tung Chen, Jie Gong, Wim Philipsen, Thomas E. Tkacik. Matisse: An Architectural Design Tool for Commodity ICs
34 -- 44Peter J. Ashenden, Philip A. Wilsey, Dale E. Martin. SUAVE: Extending VHDL to Improve Data Modeling Support
45 -- 54Rolf Ernst. Codesign of Embedded Systems: Status and Trends
56 -- 64Yeong-Ruey Shieh, Cheng-Wen Wu. Control and Observation Structures for Analog Circuits
65 -- 72Wen-Jong Fang, Allen C.-H. Wu. Integrating HDL Synthesis and Partitioning for Multi-FPGA Designs
73 -- 79Samvel K. Shoukourian. A Unified Design Methodology for Offline and Online Testing
86 -- 92Meh-Ron Amerian, William D. Atwell Jr., Ian Burgess, Gary D. Fleeman, David Y. Lepejian, T. W. Williams, Farzad Zarrinfar, Yervant Zorian. A D&T Roundtable: Testing Mixed Logic and DRAM Chips
93 -- 0. DATC Newsletter
94 -- 95. Test Technology TC Newsletter
96 -- 0Scott Davidson. The Newer Colossus