Journal: IEEE Design & Test of Computers

Volume 15, Issue 3

2 -- 0. Conference Reports
3 -- 0Yervant Zorian. Once Again, a Super Issue
4 -- 7Wilfred Corrigan. ASIC Challenges: Emerging from a Primordial Soup
8 -- 9David E. Schimmel, Chryssa Dislis. Guest Editors Introduction: Early Modeling and Analysis of Packaged Systems
10 -- 19Peter Sandborn, Mike Vertal. Analyzing Packaging Trade-Offs During System Design
20 -- 26Michael Scheffler, Daniel Ammann, Andreas Thiel, Claus M. Habiger, Gerhard Tröster. Modeling and Optimizing the Costs of Electronic Systems
28 -- 34Earl E. Swartzlander Jr.. VLSI, MCM, and WSI: A Design Comparison
35 -- 43Claudio Truzzi. The Role of the Good-Die Project in Miniaturized-System Design
44 -- 55Koppolu Sasidhar, Leon Alkalai, Abhijit Chatterjee. Testing NASA s 3D-Stack MCM Space Flight Computer
56 -- 57Wayne M. Needham. Guest Editor s Introduction: Microprocessor Testing Today
58 -- 63Jeff Brauch, Jay Fleischman. Design of Cache Test Hardware on the HP PA8500
64 -- 69R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma. Testability Features of the AMD-K6 Microprocessor
70 -- 76Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja. Test Development for Second-Generation ColdFire Microprocessors
77 -- 82Adrian Carbine, Derek Feltham. Pentium Pro Processor Design for Test and Debug
83 -- 89Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins. Testing the 500-MHz IBM S/390 Microprocessor
90 -- 97Carol Pyron, Javier Prado, James Golab. Test Strategy for the PowerPC 750 Microprocessor
98 -- 104Carol Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong. Alpha 21164 Manufacturing Test Development and Coverage Analysis
105 -- 111Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian. Effective Built-In Self-Test for Booth Multipliers
112 -- 118Michel Dubois, Jaeheon Jeong, Yong Ho Song, Adrian Moga. Rapid Hardware Prototyping on RPM-2
119 -- 124. A D&T Roundtable: Challenges for Low-Power and High-Performance Chips
125 -- 126. Test Technology TC Newsletter
126 -- 127. Design Automation Technical Committee Newsletter
128 -- 0Scott Davidson. Minutes Found on a Cave Wall