Journal: IEEE Design & Test of Computers

Volume 18, Issue 3

1 -- 0Yervant Zorian. Huge Storage Capacity
3 -- 4Rochit Rajsuman, Francky Catthoor. Guest Editors Intoduction: The New World of Large Embedded Memories
5 -- 6Alex Shubat. Moving the Market to Embedded Memory
7 -- 15Doris Keitel-Schulz, Norbert Wehn. Embedded DRAM Development: Technology, Physical Design, and Application Issues
16 -- 27Rochit Rajsuman. Design and Test of Large Embedded Memories: An Overview
28 -- 39Julie Segal, Alvin Jee, David Y. Lepejian, Ben Chu. Using Electrical Bitmap Results from Embedded Memory to Enhance Yield
40 -- 54Lode Nachtergaele, Francky Catthoor, Chidamber Kulkarni. Random-Access Data Storage Components in Customized Architectures
56 -- 68Preeti Ranjan Panda, Nikil D. Dutt, Alexandru Nicolau, Francky Catthoor, Arnout Vandecappelle, Erik Brockmeyer, Chidamber Kulkarni, Eddy de Greef. Data Memory Organization and Optimizations in Application-Specific Systems
70 -- 82Francky Catthoor, Koen Danckaert, Sven Wuytack, Nikil D. Dutt. Code Transformations for Data Transfer and Storage Exploration Preprocessing in Multimedia Processors
83 -- 97Kamran Zarrineh, Shambhu J. Upadhyaya, Vivek Chickermane. System-on-Chip Testability Using LSSD Scan Structures
98 -- 107Margarida F. Jacome, Helvio P. Peixoto. A Survey of Digital Design Reuse
108 -- 114Michael Sprachmann. Automatic Generation of Parallel CRC Circuits
115 -- 123. A D&T Roundtable: System-on-Chip Specification and Modeling Using C++: Challenges and Opportunities
127 -- 0. DATC Newsletter
128 -- 0Ahmed Amine Jerraya. Two Enduring Questions for Computer Design