Journal: IEEE Design & Test of Computers

Volume 19, Issue 1

1 -- 0. EIC Message
5 -- 0. News
6 -- 17Markus Rudack, Michael Redeker, Jörg Hilgenstock, Sören Moch, Jens Castagne. A Large-Area Integrated Multiprocessor System for Video Applications
18 -- 28Chouki Aktouf. A Complete Strategy for Testing an On-Chip Multiprocessor Architecture
29 -- 41Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly. Modeling the Economics of Testing: A DFT Perspective
42 -- 53Ismet Bayraktaroglu, Alex Orailoglu. Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST
54 -- 64Jun Zhao, Fred J. Meyer, Fabrizio Lombardi. Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems
66 -- 74Yi Cai, Bernd Laquai, Kent Luehman. Jitter Testing for Gigabit Serial Communication Transceivers
76 -- 83Philippe Magarshack. Improving SoC Design Quality through a Reproducible Design Flow
84 -- 85. Verilog and Other Standards
86 -- 87. Conference Reports
88 -- 90. Panel Summaries
91 -- 0. New Products