External Links

    Journal: IEEE Design & Test of Computers

    Volume 2, Issue 2

    21 -- 28Edward J. McCluskey. Built-In Self-Test Techniques
    29 -- 36Edward J. McCluskey. Built-In Self-Test Structures
    37 -- 48Robert P. Treuer, Hideo Fujiwara, Vinod K. Agarwal. Implementing a Built-In Self-Test PLA Design
    50 -- 58Richard J. Illman. Self-Tested Data Flow Logic: A New Approach
    59 -- 63Thomas W. Williams. Test Length in a Self-Testing Environment
    64 -- 71R. Gary Daniels, William C. Bruce. Built-In Self-Test Trends in Motorola Microprocessors
    75 -- 81Carolyn E. Tajnai. Fred Terman, the Father of Silicon Valley
    82 -- 87Donald L. Lacy, Lawrence A. Drenan. Implementing and Managing a CAD System Based on Vendor-Supplied Tools
    96 -- 100Conrad Zagwyn. New Products Test
    101 -- 103J. Daniel Nash. New Products Design
    106 -- 115A. Richard Newton, Donald O. Pederson, Alberto L. Sangiovanni-Vincentelli. Design Aids for VLSI: A Perspective Revisited
    118 -- 119Robert E. Anderson. Book Reviews
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