Journal: IEEE Design & Test of Computers

Volume 20, Issue 3

1 -- 0Rajesh Gupta. From the Editor in Chief: A Powerful Issue!
5 -- 6Sani R. Nassif, Soha Hassoun. Guest Editors Introduction: On-Chip Power Distribution Networks
7 -- 15Sachin S. Sapatnekar, Haihua Su. Analysis and Optimization of Power Grids
16 -- 22Rajendran Panda, Savithri Sundareswaran, David Blaauw. Impact of Low-Impedance Substrate on Power Supply Integrity
24 -- 31Hui Zheng, Byron Krauter, Lawrence T. Pileggi. Electrical Modeling of Integrated-Package Power and Ground Distributions
32 -- 39Arindam Mukherjee, Malgorzata Marek-Sadowska. Clock and Power Gating with Timing Closure
40 -- 47Ed Grochowski, David Ayers, Vivek Tiwari. Microarchitectural dI/dt Control
49 -- 0Yervant Zorian. Guest Editor s Introduction: Advances in Infrastructure IP
50 -- 57Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto. Online Self-Repair of FIR Filters
58 -- 66Yervant Zorian, Samvel K. Shoukourian. Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield
68 -- 77Md. Saffat Quasem, Zhigang Jiang, Sandeep K. Gupta. Benefits of a SoC-Specific Test Methodology
78 -- 87C. J. Clark, Mike Ricchetti. Infrastructure IP for Configuration and Test of Boards and Systems
88 -- 89Luciano Lavagno, Limor Fix. DAC Highlights
90 -- 96Alberto L. Sangiovanni-Vincentelli. DAC Turns 40!
97 -- 98Pat O. Pistilli. DAC: Serving the EDA Community for 40 Years
99 -- 100Ronald A. Rohrer. DAC, Moore s Law Still Drive EDA
101 -- 102Giovanni De Micheli. CASS Brings Publishing to Its DAC Partnership
104 -- 107Soha Hassoun, Geert Janssen. First CADathlon Programming Contest held at 2002 ICCAD
108 -- 0Yervant Zorian. IEEE CASS becomes D&T Copublisher
110 -- 111Andrew B. Kahng. Bringing down NRE
112 -- 113Peter J. Ashenden. VHDL-200X: The Next Revision
114 -- 0Tom Anderson. Who Cares about System Verification?
115 -- 0. Conference Reports
116 -- 117. TTTC Newsletter
118 -- 0. DATC Newsletter
120 -- 0Mary Jane Irwin. Power-Aware Designers at Odds with Power Grid Designers?