| 1 | -- | 0 | Rajesh Gupta. From the Editor in Chief: Predictability in Design and Manufacturing |
| 9 | -- | 12 | Dwight D. Hill, Andrew B. Kahng. Guest Editors Introduction: RTL to GDSII - From Foilware to Standard Practice |
| 14 | -- | 22 | Louise Trevillyan, David S. Kung, Ruchir Puri, Lakshmi N. Reddy, Michael A. Kazda. An Integrated Environment for Technology Closure of Deep-Submicron IC Designs |
| 24 | -- | 32 | Jinan Lou, Wei Chen. Crosstalk-Aware Placement |
| 34 | -- | 43 | Bin-Hong Lin, Cheng-Wen Wu, Hwei-Tsu Ann Luh. Efficient and Economical Test Equipment Setup Using Procorrelation |
| 44 | -- | 55 | Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu. Seamless Test of Digital Components in Mixed-Signal Paths |
| 56 | -- | 63 | Naran Sirisantana, Kaushik Roy. Low-Power Design Using Multiple Channel Lengths and Oxide Thicknesses |
| 65 | -- | 66 | Hans-Joachim Wunderlich, Sandeep K. Shukla. Panel Summaries |
| 68 | -- | 0 | Xiaowei Li. Conference Reports |
| 69 | -- | 0 | . Design Automation Technical Committee Newsletter |
| 70 | -- | 71 | . Test Technology TC Newsletter |
| 72 | -- | 0 | Scott Davidson. Paperless Design and Test |