| 4 | -- | 0 | Krishnendu Chakrabarty. The Quest for High-Yield IC Manufacturing |
| 5 | -- | 0 | P. Glenn Gulak, Rajesh Gupta, Gianluca Setti, Yervant Zorian. Message From the Steering Committee |
| 6 | -- | 7 | Anne E. Gattiker, Phil Nigh. Guest Editors' Introduction: Yield Learning Processes and Methods |
| 8 | -- | 18 | Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann. Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results |
| 19 | -- | 27 | Sounil Biswas, Bruce Cory. An Industrial Study of System-Level Test |
| 28 | -- | 35 | Nathan Kupp, Yiorgos Makris. Applying the Model-View-Controller Paradigm to Adaptive Test |
| 36 | -- | 47 | R. D. (Shawn) Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku. Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations |
| 48 | -- | 58 | Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee. Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures |
| 59 | -- | 62 | Rob Aitken. Yield Learning Perspectives |
| 68 | -- | 71 | Stan Krolikoski. Patents in the IEEE Standards Process |
| 76 | -- | 77 | Partha Pande. Test Technology TC Newsletter |
| 80 | -- | 0 | Scott Davidson. Yield of Black Swans |