Journal: IEEE Design & Test of Computers

Volume 29, Issue 6

4 -- 0Krishnendu Chakrabarty. Towards more digital content in wireless systems [From the EiC]
5 -- 6Haralampos-G. D. Stratigopoulos, Alberto Valdes-Garcia. Guest Editors' Introduction: Digitally Enhanced Wireless Transceivers
7 -- 18Robert Bogdan Staszewski. Digitally intensive wireless transceivers
19 -- 26Rashmi Nanda, Dejan Markovic. Digitally intensive receiver design: opportunities and challenges
27 -- 39Christopher Maxey, Sanjay Raman, Kari Groves, Tony Quach 0001, Pompei L. Orlando, Aji Mattamana, Gregory L. Creech, Jay Rockway. Mixed-Signal SoCs With In Situ Self-Healing Circuitry
40 -- 51Charles Chien, Adrian Tang 0002, Frank Hsiao, Mau-Chung Frank Chang. Dual-Control Self-Healing Architecture for High-Performance Radio SoCs
52 -- 55Erik Jan Marinissen. Pioneering in Asia With the US Venture Capital Model
57 -- 65Megan Wachs, Ofer Shacham, Zain Asgar, Amin Firoozshahian, Stephen Richardson, Mark Horowitz. Bringing up a chip on the cheap
66 -- 73Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente. Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection
74 -- 83Ting Zhu, Michael B. Steer, Paul D. Franzon. Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits
84 -- 90Jake Buurma, Robert Sayah, Fred Valente, Cathy Rodgers. OpenDFM Bridging the Gap Between DRC and DFM
91 -- 99Markus Seuring, Michael Braun, Alan Ma, Geir Eide, Kathy Yang, Huaxing Tang. Employing the STDF V4-2007 Standard for Scan Test Data Logging
101 -- 102Andrew B. Kahng. Predicting the future of information technology and society [The Road Ahead]
111 -- 112Theo Theocharides. Test Technology TC Newsletter

Volume 29, Issue 5

8 -- 17John Keane, Chris H. Kim, Qunzeng Liu, Sachin S. Sapatnekar. Process and Reliability Sensors for Nanoscale CMOS
18 -- 26Min Chen, Vijay Reddy, Srikanth Krishnan, Venkatesh Srinivasan, Yu Cao. Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors
27 -- 36Jackson Pachito, Celestino V. Martins, B. Jacinto, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira. Aging-Aware Power or Frequency Tuning With Predictive Fault Detection
37 -- 46Seetharam Narasimhan, Wen Yueh, Xinmu Wang, Saibal Mukhopadhyay, Swarup Bhunia. Improving IC Security Against Trojan Attacks Through Integration of Security Monitors
47 -- 53M. Kamm, H. Jun, L. Boluna. SerDes Interoperability and Optimization
55 -- 62S. Sunter, A. Roy. Contactless Test of IC Pads, Pins, and TSVs via Standard Boundary Scan
63 -- 71Masahiro Ishida, Kiyotaka Ichiyama, Tasuku Fujibe, Daisuke Watanabe, Masayuki Kawabata. Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost
72 -- 80Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing. Defect Oriented Testing for Analog/Mixed-Signal Designs
81 -- 93Wing Chiu Tam, Ronald D. Blanton. Physically-Aware Analysis of Systematic Defects in Integrated Circuits
94 -- 99Michael Nicolaidis. Biologically Inspired Robust Tera-Device Processors
102 -- 104Stan Krolikoski. Two Approaches to Handling Late Essential/Necessary Patent Claims Against Standards

Volume 29, Issue 4

4 -- 0Krishnendu Chakrabarty. Electronic Design Methods and Technologies for Green Buildings
5 -- 7Yuvraj Agarwal, Anand Raghunathan. Guest Editors' Introduction: Green Buildings
8 -- 16Mary Ann Piette, Jessica Granderson, Michael Wetter, Sila Kiliccote. Intelligent Building Energy Information and Control Systems for Low-Energy Operations and Optimal Demand Response
17 -- 25Kamin Whitehouse, Juhi Ranjan, Jiakang Lu, Tamim I. Sookoor, Mehdi Saadat, Carrie Meinberg Burke, Galen Staengl, Anselmo Canfora, Hossein Haj-Hariri. Towards Occupancy-Driven Heating and Cooling
26 -- 35Mehdi Maasoumy, Alberto L. Sangiovanni-Vincentelli. Total and Peak Energy Consumption Minimization of Building HVAC Systems Using Model Predictive Control
36 -- 44Thomas Weng, Yuvraj Agarwal. From Buildings to Smart Buildings - Sensing and Actuation to Improve Energy Efficiency
45 -- 55Yang Yang, Qi Zhu, Mehdi Maasoumy, Alberto L. Sangiovanni-Vincentelli. Development of Building Automation and Control Systems
56 -- 57Stephen Dawson-Haggerty, Jorge Ortiz, Jason Trager, David E. Culler, Randy H. Katz. Energy Savings and the "Software-Defined" Building
58 -- 60Mani Srivastava. From measurements to sustainable choices [Persepectives]
61 -- 0Scott Davidson. Energy Efficiency Like Your Momma Used to Make
63 -- 70Stephan Eggersglüß, Rolf Drechsler. A Highly Fault-Efficient SAT-Based ATPG Flow
71 -- 79Haralampos-G. D. Stratigopoulos, Salvador Mir. Adaptive Alternate Analog Test
80 -- 91Víctor H. Champac, Julio Vazquez Hernandez, Salvador Barcelo, Roberto Gómez, Chuck Hawkins, Jaume Segura. Testing of Stuck-Open Faults in Nanometer Technologies
92 -- 99Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang. Scan-Based Speed-Path Debug for a Microprocessor
103 -- 104Partha Pande. Test Technology TC Newsletter

Volume 29, Issue 3

4 -- 0Krishnendu Chakrabarty. Looking ahead at the role of electronic design automation in synthetic biology [From the EIC]
5 -- 6Douglas Densmore, Soha Hassoun. Guest Editors' Introduction: Synthetic Biology
7 -- 20Douglas Densmore, Soha Hassoun. Design Automation for Synthetic Biological Systems
21 -- 31Hua Jiang, Marc D. Riedel, Keshab K. Parhi. Digital Signal Processing With Molecular Reactions
32 -- 39Curtis Madsen, Chris J. Myers, Tyler Patterson, Nicholas Roehner, Jason T. Stevens, Chris Winstead. Design and Test of Genetic Circuits Using ${\tt iBioSim}$iBioSim
40 -- 48Jaydeep P. Bardhan. Fast Solvers for Molecular Science and Engineering
49 -- 50Alberto L. Sangiovanni-Vincentelli. EDA meets biology! The bumpy road ahead [Perscetives]
51 -- 0Scott Davidson. At the beginning
52 -- 59Michael Jassowski. Organizational Dynamics: Understanding the Impact of Organizational Structure in Team Productivity
60 -- 69Silvia Franchini, Antonio Gentile, Filippo Sorbello, Giorgio Vassallo, Salvatore Vitabile. Design Space Exploration of Parallel Embedded Architectures for Native Clifford Algebra Operations
70 -- 79Seetharam Narasimhan, Rajat Subhra Chakraborty, Swarup Chakraborty. Hardware IP Protection During Evaluation Using Embedded Sequential Trojan
80 -- 88Satrajit Chatterjee, Michael Kishinevsky, Ümit Y. Ogras. xMAS: Quick Formal Modeling of Communication Fabrics to Enable Verification
90 -- 92Stan Krolikoski. That's not our job! [Standards]
95 -- 96Theocharis Theocharides. Test Technology TC Newsletter

Volume 29, Issue 2

4 -- 0Krishnendu Chakrabarty. Standards, Interoperability, and Innovation in a Disaggregated IC Industry
5 -- 7Shishpal S. Rawat, Sumit Dasgupta. Guest Editors' Introduction: Special Issue on EDA Industry Standards
8 -- 13John Sanguinetti. Abstraction and Standardization in Hardware Design
14 -- 22Trevor Wieman, Bishnupriya Bhattacharya, Tor E. Jeremiassen, Christian Schroder, Bart Vanthournout. An Overview of Open SystemC Initiative Standards Development
23 -- 31Doron Bustan, Dmitry Korchemny, Erik Seligman, Jin Yang. SystemVerilog Assertions: Past, Present, and Future SVA Standardization Experience
32 -- 43John Stickley, Deepak Kumar Garg, Brian Bailey, Jaekwang Lee, Amy Lim, Per Bojsen, Ramesh Chandra, Ajeya Prabhakar. Understanding the Accellera SCE-MI Transaction Pipes
44 -- 52Mark Hahn. OpenAccess: Standard and Practices
53 -- 61Rich Morse. Interoperable Design Constraints for Custom IC Design
62 -- 70Susan Carver, Anmol Mathur, Lalit Sharma, Prasad Subbarao, Steve Urish, Qi Wang. Low-Power Design Using the Si2 Common Power Format
71 -- 78Nagu R. Dhanwada, David J. Hathaway, Jerry Frenkil, W. Rhett Davis, Harun Demircioglu. Leakage Power Contributor Modeling
79 -- 88Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson. Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
89 -- 92Nick English, Yatin Trivedi. Standards and Collaboration Perspectives: Yesterday, Today, and Tomorrow [Perspectives]
100 -- 102Bill Eklow. Managing Complex Boundary-Scan Operations
107 -- 108Partha Pande. Test Technology TC Newsletter
112 -- 0Scott Davidson. A World Without Standards

Volume 29, Issue 1

4 -- 0Krishnendu Chakrabarty. The Quest for High-Yield IC Manufacturing
5 -- 0P. Glenn Gulak, Rajesh Gupta, Gianluca Setti, Yervant Zorian. Message From the Steering Committee
6 -- 7Anne E. Gattiker, Phil Nigh. Guest Editors' Introduction: Yield Learning Processes and Methods
8 -- 18Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann. Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results
19 -- 27Sounil Biswas, Bruce Cory. An Industrial Study of System-Level Test
28 -- 35Nathan Kupp, Yiorgos Makris. Applying the Model-View-Controller Paradigm to Adaptive Test
36 -- 47R. D. (Shawn) Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku. Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations
48 -- 58Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee. Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures
59 -- 62Rob Aitken. Yield Learning Perspectives
68 -- 71Stan Krolikoski. Patents in the IEEE Standards Process
76 -- 77Partha Pande. Test Technology TC Newsletter
80 -- 0Scott Davidson. Yield of Black Swans