Farrokh Ghani Zadegan - researchr alias

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Viewing Publication 1 - 22 from 22

2022

Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System BusFarrokh Ghani Zadegan, Zilin Zhang, Kim Petersén, Erik Larsson. itc 2022: 219-228 [doi]

2018

Test of Reconfigurable Modules in Scan NetworksRiccardo Cantoro, Farrokh Ghani Zadegan, Marco Palena, Paolo Pasini, Erik Larsson, Matteo Sonza Reorda. TC, 67(12):1806-1817, 2018. [doi]

On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 NetworksFarrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson. TC, 67(2):237-251, 2018. [doi]

2017

Reconfigurable On-Chip Instrument Access Networks: Analysis, Design, Operation, and ApplicationFarrokh Ghani Zadegan. PhD thesis, Lund University, Sweden, 2017. [doi]

2016

On the diagnostic analysis of IEEE 1687 networksRiccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson. ets 2016: 1-2 [doi]

Automatic generation of stimuli for fault diagnosis in IEEE 1687 networksRiccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson. iolts 2016: 167-172 [doi]

Accessing on-chip instruments through the life-time of systemsErik Larsson, Farrokh Ghani Zadegan. latw 2016: 2-4 [doi]

A suite of IEEE 1687 benchmark networksAnton Tsertov, Artur Jutman, Sergei Devadze, Matteo Sonza Reorda, Erik Larsson, Farrokh Ghani Zadegan, Riccardo Cantoro, Mehrdad Montazeri, Rene Krenz-Baath. itc 2016: 1-10 [doi]

A self-reconfiguring IEEE 1687 network for fault monitoringFarrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson. ets 2016: 1-6 [doi]

Upper-bound computation for optimal retargeting in IEEE1687 networksFarrokh Ghani Zadegan, Rene Krenz-Baath, Erik Larsson. itc 2016: 1-10 [doi]

In-field system-health monitoring based on IEEE 1687Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson. socc 2016: 69-74 [doi]

2015

On the testability of IEEE 1687 networksRiccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson. ats 2015: 211-216 [doi]

Access time minimization in IEEE 1687 networksRene Krenz-Baath, Farrokh Ghani Zadegan, Erik Larsson. itc 2015: 1-10 [doi]

2014

2012

Accessing Embedded DfT Instruments with IEEE P1687Erik Larsson, Farrokh Ghani Zadegan. ats 2012: 71-76 [doi]

Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson. dt, 29(2):79-88, 2012. [doi]

Access Time Analysis for IEEE P1687Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson. TC, 61(10):1459-1472, 2012. [doi]

2011

Test Scheduling in an IEEE P1687 Environment with Resource and Power ConstraintsFarrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson, Erik Larsson. ats 2011: 525-531 [doi]

Design automation for IEEE P1687Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson. date 2011: 1412-1417 [doi]

2010

Test Time Analysis for IEEE P1687Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson. ats 2010: 455-460 [doi]

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