Journal: IEEE Design & Test of Computers

Volume 29, Issue 6

4 -- 0Krishnendu Chakrabarty. Towards more digital content in wireless systems [From the EiC]
5 -- 6Haralampos-G. D. Stratigopoulos, Alberto Valdes-Garcia. Guest Editors' Introduction: Digitally Enhanced Wireless Transceivers
7 -- 18Robert Bogdan Staszewski. Digitally intensive wireless transceivers
19 -- 26Rashmi Nanda, Dejan Markovic. Digitally intensive receiver design: opportunities and challenges
27 -- 39Christopher Maxey, Sanjay Raman, Kari Groves, Tony Quach 0001, Pompei L. Orlando, Aji Mattamana, Gregory L. Creech, Jay Rockway. Mixed-Signal SoCs With In Situ Self-Healing Circuitry
40 -- 51Charles Chien, Adrian Tang 0002, Frank Hsiao, Mau-Chung Frank Chang. Dual-Control Self-Healing Architecture for High-Performance Radio SoCs
52 -- 55Erik Jan Marinissen. Pioneering in Asia With the US Venture Capital Model
57 -- 65Megan Wachs, Ofer Shacham, Zain Asgar, Amin Firoozshahian, Stephen Richardson, Mark Horowitz. Bringing up a chip on the cheap
66 -- 73Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente. Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection
74 -- 83Ting Zhu, Michael B. Steer, Paul D. Franzon. Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits
84 -- 90Jake Buurma, Robert Sayah, Fred Valente, Cathy Rodgers. OpenDFM Bridging the Gap Between DRC and DFM
91 -- 99Markus Seuring, Michael Braun, Alan Ma, Geir Eide, Kathy Yang, Huaxing Tang. Employing the STDF V4-2007 Standard for Scan Test Data Logging
101 -- 102Andrew B. Kahng. Predicting the future of information technology and society [The Road Ahead]
111 -- 112Theo Theocharides. Test Technology TC Newsletter