Journal: IEEE Design & Test of Computers

Volume 29, Issue 2

4 -- 0Krishnendu Chakrabarty. Standards, Interoperability, and Innovation in a Disaggregated IC Industry
5 -- 7Shishpal S. Rawat, Sumit Dasgupta. Guest Editors' Introduction: Special Issue on EDA Industry Standards
8 -- 13John Sanguinetti. Abstraction and Standardization in Hardware Design
14 -- 22Trevor Wieman, Bishnupriya Bhattacharya, Tor E. Jeremiassen, Christian Schroder, Bart Vanthournout. An Overview of Open SystemC Initiative Standards Development
23 -- 31Doron Bustan, Dmitry Korchemny, Erik Seligman, Jin Yang. SystemVerilog Assertions: Past, Present, and Future SVA Standardization Experience
32 -- 43John Stickley, Deepak Kumar Garg, Brian Bailey, Jaekwang Lee, Amy Lim, Per Bojsen, Ramesh Chandra, Ajeya Prabhakar. Understanding the Accellera SCE-MI Transaction Pipes
44 -- 52Mark Hahn. OpenAccess: Standard and Practices
53 -- 61Rich Morse. Interoperable Design Constraints for Custom IC Design
62 -- 70Susan Carver, Anmol Mathur, Lalit Sharma, Prasad Subbarao, Steve Urish, Qi Wang. Low-Power Design Using the Si2 Common Power Format
71 -- 78Nagu R. Dhanwada, David J. Hathaway, Jerry Frenkil, W. Rhett Davis, Harun Demircioglu. Leakage Power Contributor Modeling
79 -- 88Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson. Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
89 -- 92Nick English, Yatin Trivedi. Standards and Collaboration Perspectives: Yesterday, Today, and Tomorrow [Perspectives]
100 -- 102Bill Eklow. Managing Complex Boundary-Scan Operations
107 -- 108Partha Pande. Test Technology TC Newsletter
112 -- 0Scott Davidson. A World Without Standards