Journal: IEEE Design & Test of Computers

Volume 34, Issue 3

4 -- 5Jörg Henkel. Emerging Memory Technologies
6 -- 7Yiran Chen, Tei-Wei Kuo, Barbara De Salvo. Guest Editors' Introduction: Critical and Enabling Techniques for Emerging Memories
8 -- 22Yiran Chen, Hai Helen Li, Ismail Bayram, Enes Eken. Recent Technology Advances of Emerging Memories
23 -- 30Mouhamad Alayan, Elisa Vianello, Barbara De Salvo, Luca Perniola, Andrea Padovani, Luca Larcher. 2-Based RRAM
31 -- 41Shivam Swami, Kartik Mohanram. Reliable Nonvolatile Memories: Techniques and Measures
42 -- 49Caiwen Ding, Ning Liu, Yanzhi Wang, Ji Li, Soroush Heidari, Jingtong Hu, Yongpan Liu. Multisource Indoor Energy Harvesting for Nonvolatile Processors
50 -- 58Kai-li Wang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang. Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package
59 -- 67Hussam Amrouch, Victor M. van Santen, Jörg Henkel. Interdependencies of Degradation Effects and Their Impact on Computing
68 -- 92Prabhat Mishra, Ronny Morad, Avi Ziv, Sandip Ray. Post-Silicon Validation in the SoC Era: A Tutorial Introduction
93 -- 95Krishnendu Chakrabarty. Quo Vadis Test? The Past, the Present, and the Future: No Longer a Necessary Evil
96 -- 102David Yeh. Designing Secure Electronics: Challenges From a Hardware Perspective
103 -- 104Naofumi Takagi. Recap of the 22nd Asia and South- Pacific Design Automation Conference
105 -- 107Scott Davidson. Cyber-Physical System Design With Sensor Networking Technologies
108 -- 109José L. Ayala. Code Ocean Is Live: Upload Your Algorithms
110 -- 111Theo Theocharides. Test Technology TC Newsletter
112 -- 0Scott Davidson. Being Connected