Journal: IEEE Design & Test of Computers

Volume 34, Issue 5

4 -- 0Jörg Henkel. Verification and Test
5 -- 6Magdy S. Abadir, Jayanta Bhadra, Wen Chen, Li-C. Wang. Guest Editors' Introduction: Emerging Challenges and Solutions in SoC Verification
7 -- 22Wen Chen, Sandip Ray, Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang. Challenges and Trends in Modern SoC Design Verification
23 -- 29Wen Chen, Kuo-Kai Hsieh, Li-Chung Wang, Jayanta Bhadra. Data-Driven Test Plan Augmentation for Platform Verification
30 -- 37Syeda Hira Taqdees, Osman Hasan. Formally Verifying Transfer Functions of Linear Analog Circuits
38 -- 46Gianpiero Cabodi, Paolo Camurati, Sebastiano F. Finocchiaro, Francesco Savarese, Danilo Vendraminetto. Embedded Systems Secure Path Verification at the Hardware/Software Interface
47 -- 53John Adler, Andreas G. Veneris. Leveraging Software Configuration Management in Automated RTL Design Debug
54 -- 62Maroua Ben Slimane, Imene Ben Hafaiedh, Riadh Robbana. Formal-Based Design and Verification of SoC Arbitration Protocols: A Comparative Analysis of TDMA and Round-Robin
63 -- 71Huanyu Wang, Domenic Forte, Mark M. Tehranipoor, Qihang Shi. Probing Attacks on Integrated Circuits: Challenges and Research Opportunities
72 -- 79Ran Wang, Krishnendu Chakrabarty. Tackling Test Challenges for Interposer-Based 2.5-D Integrated Circuits
80 -- 87Francky Catthoor, Guido Groeseneken. Will Chips of the Future Learn How to Feel Pain and Cure Themselves?
90 -- 96Yao-Wen Chang. An Interview With Professor Chenming Hu, Father of 3D Transistors
97 -- 98Scott Davidson. Engineering Secure Internet of Things Systems
99 -- 100José Luis Ayala. IEEE Rebooting Computing Week
101 -- 102Theo Charides. Test Technology TC Newsletter
103 -- 0Alvaro Cardenas. Corrections
104 -- 0Scott Davidson. To Verification Infinity and Beyond