Journal: IEEE Design & Test of Computers

Volume 34, Issue 6

4 -- 5Jörg Henkel. Self-Aware On-Chip Systems
6 -- 7Axel Jantsch, Nikil D. Dutt. Guest Editorial: Special Issue on Self-Aware Systems on Chip
8 -- 26Axel Jantsch, Nikil D. Dutt, Amir M. Rahmani. Self-Awareness in Systems on Chip - A Survey
27 -- 35Konstantin Shibin, Sergei Devadze, Artur Jutman, Martin Grabmann, Robin Pricken. Health Management for Self-Aware SoCs Based on IEEE 1687 Infrastructure
36 -- 45James J. Davis, Joshua M. Levine, Edward A. Stott, Eddie Hung, Peter Y. K. Cheung, George A. Constantinides. KOCL: Power Self- Awareness for Arbitrary FPGA-SoC-Accelerated OpenCL Applications
46 -- 53Davide Rossi, Igor Loi, Antonio Pullini, Christoph Muller, Andreas Burg, Francesco Conti 0001, Luca Benini, Philippe Flatresse. A Self-Aware Architecture for PVT Compensation and Power Nap in Near Threshold Processors
54 -- 62Hans Giesen, Raphael Rubin, Benjamin Gojman, André DeHon. Self-Adaptive Timing Repair
63 -- 76Angelos Antonopoulos, Christiana Kapatsori, Yiorgos Makris. Trusted Analog/Mixed- Signal/RF ICs: A Survey and a Perspective
77 -- 83Katherine Shu-Min Li, Sying-Jyan Wang, Ruei-Ting Gu, Bo-Chuan Cheng. Layout-Aware Optimized Prebond Silicon Interposer Test Synthesis
84 -- 93Dongyeob Shin, Jongsun Park, Jangwon Park, Somnath Paul, Swarup Bhunia. Adaptive ECC for Tailored Protection of Nanoscale Memory
94 -- 101Mohsen Imani, John Hwang, Tajana Rosing, Abbas Rahimi, Jan M. Rabaey. Low-Power Sparse Hyperdimensional Encoder for Language Recognition
102 -- 108Lothar Thiele. Internet of Things - The Quest for Trust
109 -- 118Patrick Mayor, Martin Rajman, Giovanni De Micheli. Nano-Tera.ch: Information Technology for Health, Environment, and Energy
119 -- 120Maria K. Michael, Haralampos-G. D. Stratigopoulos. Recap of the European Test Symposium 2017 (ETS'17)
121 -- 122David Garrett, Chia-Lin Yang. Recap of the 2017 International Symposium on Low Power Electronics and Design (ISLPED)
123 -- 124José Luis Ayala. CEDA Currents
125 -- 126Theo Theocharides. Test Technology TC Newsletter
128 -- 0Scott Davidson. Chips Thinking About Chips