Journal: IEEE Design & Test of Computers

Volume 40, Issue 1

4 -- 0Partha Pratim Pande. Machine Learning for CAD/EDA
5 -- 7Ulf Schlichtmann, Bing Li 0005, Bei Yu 0001, Raviv Gal. Guest Editors' Introduction: Special Issue on Machine Learning for CAD/EDA
8 -- 16Andrew B. Kahng. Machine Learning for CAD/EDA: The Road Ahead
17 -- 33Tinghuan Chen, Grace Li Zhang, Bei Yu 0001, Bing Li 0005, Ulf Schlichtmann. Machine Learning in Advanced IC Design: A Methodological Survey
34 -- 42Styliani Tompazi, Ioannis Tsiokanos, Jesús Martínez del Rincón, Georgios Karakonstantis. Estimating Code Vulnerability to Timing Errors Via Microarchitecture-Aware Machine Learning
43 -- 51Lorenzo Servadei, Jin Hwa Lee, José Antonio Arjona-Medina, Michael Werner, Sepp Hochreiter, Wolfgang Ecker, Robert Wille. Deep Reinforcement Learning for Optimization at Early Design Stages
52 -- 61Cheng Zhuo, Di Gao, Yuan Cao, Tianhao Shen, Li Zhang 0021, Jinfang Zhou, Xunzhao Yin. A DVFS Design and Simulation Framework Using Machine Learning Models
62 -- 69Peng Cao 0002, Tai Yang, Kai Wang, Wei Bao, Hao Yan. Topology-Aided Multicorner Timing Predictor for Wide Voltage Design
70 -- 76Haoxing Ren, Brucek Khailany, Matthew Fojtik, Yanqing Zhang. Machine Learning and Algorithms: Let Us Team Up for EDA
77 -- 84Luis Francisco, W. Rhett Davis, Paul D. Franzon. A Deep Transfer Learning Design Rule Checker With Synthetic Training
85 -- 95Srinivasan Subramaniyan, Oscar Ferraz, M. R. Ashuthosh, Santosh Krishna, Guohui Wang, Joseph R. Cavallaro, Vítor Silva 0001, Gabriel Falcão 0001, Madhura Purnaprajna. Enabling High-Level Design Strategies for High-Throughput and Low-Power NB-LDPC Decoders
96 -- 104Blaise Ravelo, Alexandre Douyère, Yang Liu, Wenceslas Rahajandraibe, Fayu Wan, George Chan, Mathieu Guerin. Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test
105 -- 107Charles Augustine, Hai Helen Li. ISLPED 2022: An Experience of a Hybrid Conference in the Time of COVID-19
108 -- 111Aviral Shrivastava, Xiaobo Sharon Hu. Report on the 2022 Embedded Systems Week (ESWEEK)
112 -- 115Nicola Nicolici. Interview With Janet Olson
116 -- 0Scott Davidson. Training Data Sets: The Source of Our Woes?