Journal: IEEE Design & Test of Computers

Volume 40, Issue 2

4 -- 0Partha Pratim Pande. Special Issue on Testability and Dependability of Artificial Intelligence Hardware
5 -- 7Fei Su, Chunsheng Liu, Haralampos-G. Stratigopoulos. Special Issue on Testability and Dependability of Artificial Intelligence Hardware
8 -- 58Fei Su, Chunsheng Liu, Haralampos-G. Stratigopoulos. Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives
59 -- 66Elbruz Ozen, Alex Orailoglu. Shaping Resilient AI Hardware Through DNN Computational Feature Exploitation
67 -- 74Timoteo García Bertoa, Giulio Gambardella, Nicholas J. Fraser, Michaela Blott, John McAllister. Fault-Tolerant Neural Network Accelerators With Selective TMR
75 -- 81Patrik Omland, Yang Peng, Michael Paulitsch, Jorge Parra, Gustavo Espinosa, Abishai Daniel, Gereon Hinz, Alois C. Knoll. API-Based Hardware Fault Simulation for DNN Accelerators
82 -- 89Sanmitra Banerjee, Mahdi Nikdast, Krishnendu Chakrabarty. On the Impact of Uncertainties in Silicon-Photonic Neural Networks
90 -- 99Shamik Kundu, Arnab Raha, Suvadeep Banerjee, Suriyaprakash Natarajan, Kanad Basu. Analysis and Mitigation of DRAM Faults in Sparse-DNN Accelerators
100 -- 108Ankita Paul, Shihao Song, Twisha Titirsha, Anup Das 0001. On the Mitigation of Read Disturbances in Neuromorphic Inference Hardware
109 -- 117Josie E. Rodriguez Condia, Felipe Augusto da Silva, Ahmet Çagri Bagbaga, Juan-David Guerrero-Balaguera, Said Hamdioui, Christian Sauer 0001, Matteo Sonza Reorda. Using STLs for Effective In-Field Test of GPUs
118 -- 126Taochen Gu, Fayu Wan, Jingjie Zhou, Qizheng Ji, Binhong Li, Blaise Ravelo. T-Topology Coupler-Based Bandpass Negative Group Delay Active Circuit Design and Test
127 -- 136Tao Zhang, Fahim Rahman, Mark M. Tehranipoor, Farimah Farahmandi. FPGA-Chain: Enabling Holistic Protection of FPGA Supply Chain With Blockchain Technology
137 -- 138Tulika Mitra. The 2022 International Conference on Computer-Aided Design (ICCAD)
139 -- 0Scott Davidson. Is There an Answer?