Journal: IEEE Design & Test of Computers

Volume 40, Issue 4

4 -- 0Partha Pratim Pande. 40th IEEE VLSI Test Symposium 2022
5 -- 16Bora Bilgic, Sule Ozev. Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation
17 -- 24Amit Pandey, Brendan Tully, Abhijeet Samudra, Ajay Nagarandal, Karthikeyan Natarajan, Rahul Singhal. Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O
25 -- 33Mahmut Yilmaz, Pavan Kumar Datla Jagannadha, Kaushik Narayanun, Shantanu Sarangi, Francisco Da Silva, Joe Sarmiento. NVIDIA MATHS: Mechanism to Access Test-Data Over High-Speed Links
34 -- 41Aibin Yan, Yuting He, Xiaoxiao Niu, Jie Cui 0004, Tianming Ni, Zhengfeng Huang, Patrick Girard 0001, Xiaoqing Wen. A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications
42 -- 50Soyed Tuhin Ahmed, Mehdi B. Tahoori. Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration
51 -- 60Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Matteo Sonza Reorda. STLs for GPUs: Using High-Level Language Approaches
61 -- 68K. Ramakrishna Kini, Muddu Madakyaru, Fouzi Harrou, Ying Sun 0002. Detecting Pediatric Foot Deformities Using Plantar Pressure Measurements: A Semisupervised Approach
69 -- 77Boris Orostica, Isaac Núñez, Tamara Matúte, Felipe Núñez 0001, Fernan Federici. Building an Open-Source DNA Assembler Device
78 -- 0Scott Davidson. Our Gated Community