External Links

    Journal: IEEE Design & Test of Computers

    Volume 6, Issue 3

    8 -- 34M. Dannie Durand. Parallel simulated annealing: accuracy vs. speed in placement
    36 -- 42William T. Lee. Engineering a device for electron-beam probing
    50 -- 51Shigehiro Funatsu, Masato Kawai, Akihiko Yamada. Scan design at NEC
    58 -- 65Nagesh Vasanthavada, Nick Kanopoulos. A built-in test module for fault isolation
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