External Links

    Journal: IEEE Design & Test of Computers

    Volume 6, Issue 4

    18 -- 30Kenneth P. Parker. The impact of boundary scan on board test
    32 -- 48Bulent I. Dervisoglu. Scan-path architecture for pseudorandom testing
    49 -- 60John A. Waicukauski, Eric Lindbloom. Failure diagnosis of structured VLSI
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