IEEE Design & Test of Computers

0	--	0	. D&T News
4	--	0	. Editorial Calendar
6	--	8	Ben Bennetts. Test Technology in Europe
9	--	19	R. P. van Riessen, Hans G. Kerkhoff, A. Kloppenburg. Designing and Implementing an Architecture with Boundary Scan
20	--	25	Hugu K. Seitz, Armin Blacha, Rolf Clauberg, H. Beha, J. Feder. Contactless High-Speed Waveform Measurements on Gallium
26	--	38	Phil Nigh, Wojciech Maly. Test Generation for Current Testing (CMOS ICs)
39	--	45	Bas Verhelst. Using a Test-Specification Format in Automatic Test-Program Generation
46	--	54	. The Challenges of Self-Test
56	--	62	. A D&T Roundtable: Behavioral Description Languages, Part 1: Are Designers Benefitting?
63	--	67	. The 1989 Annual Index
70	--	71	. DATC Newsletter

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